Wayne Zhao is an industry expert in advanced transmission electron microscopy (TEM) and physical failure analysis, with over 25 years of dedicated hands-on experience in various wafer fabrication environments, including positions at IBM, GlobalFoundries, and Infineon Technologies. They have received multiple awards, including the Albert Nelson Marquis Lifetime Achievement Award and recognition from the Microscopy Society of America. Currently, Wayne works as a Senior TEM Engineer at IBM, focusing on advanced characterizations for cutting-edge semiconductor technologies. They possess extensive knowledge in materials science and have held numerous technical leadership roles throughout their career, contributing to both academic and industrial research.
This person is not in the org chart
This person is not in any teams
This person is not in any offices