Ivan Ciofi is a Principal Scientist and R&D Team Leader at imec, specializing in interconnect performance and reliability. With over 20 years of experience in BEOL process technology, electrical characterization, and modeling, Ivan has a proven track record in developing calibrated models and benchmarking metallization options for next-generation integrated circuits. Ivan earned a PhD in Electronic Engineering from the University of Pisa, where research focused on the reliability of metallic interconnects. They continue to enhance their expertise with a Master’s degree in Electronic Engineering from the same institution.
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