Mohamed Saib is a Principal Member of Technical Staff in Metrology with over 21 years of experience in project management, semiconductor metrology, and advanced data analysis. Currently, they are focused on designing revolutionary approaches for massive and hybrid metrology at imec, after serving as the Program Technical Lead for Advanced Memory. Their previous roles include Research Engineer at imec and ASELTA Nanographics, where they specialized in optical metrology and electron beam lithography. Mohamed holds a PhD in Electronics and Microelectronics from Basse Normandie University and has contributed significantly to the field, with over 5 patent disclosures and 17 publications.
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