Geoff Lee is currently a Test Engineering Manager at Infineon, where they manage production support and reliability efforts. Previously, they held various engineering and project management roles at companies including Microchip Technology Inc., IXYS Corporation, and Vitesse Semiconductor. Geoff earned double bachelor’s degrees in Industrial Management Science and Electrical Engineering from 國立成功大學 from 1998 to 2002. Their extensive experience spans project management, production monitoring, and new product introduction (NPI) support across multiple organizations.
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