Keith Knauer, Ph.D., has been serving as a Yield Analysis and Process Development Manager, as well as a Yield Analysis and Process Development Engineer at Intel Corporation since November 2014, where responsibilities include analyzing and synthesizing data from experiments to inform microprocessor development. Previously, Keith held an internship in the Office of the CTO at Applied Materials in 2013, focusing on research involving thin films for encapsulating organic light-emitting diodes (OLEDs). Keith earned a Doctor of Philosophy in Electrical and Computer Engineering from the Georgia Institute of Technology in 2014 and a Bachelor's degree in Electrical and Computer Engineering from the University of Florida in 2009.
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