Man L. is a results-driven professional with over 8 years of experience in circuit analysis, failure analysis, and material analysis. Currently serving as a Staff Yield Development Engineer at Intel Corporation, Man has previously held positions as a Senior Failure Analysis R&D Engineer and a Postdoctoral Research Associate. Man's academic background includes a Ph.D. in Materials Science and a Master's in Material Science and Engineering from Arizona State University, along with a Bachelor's in Polymer Material and Engineering from Hubei University of Technology. Man is recognized for expertise in semiconductor packaging reliability, process optimization, and a strong commitment to driving efficiency and innovation.
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