Peter Wells is currently the TD Engineering Group Leader at Intel, where they specialize in the characterization of semiconductors using atom probe tomography. Previously, they served as a Failure Analysis R&D Engineer at Intel from 2017 to 2020 and led a post-irradiation examination program as an Assistant Researcher at the University of California, Santa Barbara. Peter earned a Doctor of Philosophy in Materials Science from the University of California, Santa Barbara, and a Bachelor of Science in Mechanical Engineering from the University of Idaho.
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