Zhang David is a Senior Director of Quality & Reliability, overseeing design service and product yield at Intel Corporation since 2016. They previously held various roles at Intel from 2005 to 2008, including QnR Department Manager and Quality and Reliability Manager, where they managed factory quality reliability and led new fab certifications. Prior to joining Intel, Zhang worked as a Wafer Fab Device and FA Engineer at Motorola and served as Product & Yield Manager at SMIC, focusing on yield improvement and customer interface activities for various semiconductor products. Zhang holds a Master's degree in Material Science and Engineering from Beijing University of Aeronautics and Astronautics, earned between 1998 and 2000.
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