Bob Neves is the Chairman and CTO of Reliability Assessment Solutions Inc., the manufacturer of the HATS²™ Via Structure Reliability and Robustness Tester. They founded and led Microtek Laboratories, an independent test facility with offices in Jiangsu, China, and California, showcasing their expertise in electronics testing. With significant contributions to industry organizations, Bob served as the chairman of the Board for IPC and was inducted into the IPC Hall of Fame. They earned multiple awards for their service and have published numerous articles on reliability and testing methods. Bob is currently pursuing degrees in Pre-Engineering at Pacific Union College and Electrical Engineering at California State Polytechnic University-Pomona.
This person is not in the org chart
This person is not in any teams
This person is not in any offices