Jon Kim is an experienced R&D Manager at Keysight Technologies since November 2013, leading a globally distributed department focused on model-based measurement, encapsulating IP in models, and developing next-generation measurement software. Prior to this, Jon held various leadership positions at Agilent Technologies from 2000 to 2013, including Engineering Manager and Engineering Program Manager, where responsibilities included the design of advanced microscopes and the management of distributed teams in diagnostic technology development. With deep expertise in process engineering and firmware development, and a foundational background in electrical engineering from California Polytechnic State University-San Luis Obispo, Jon has contributed to significant innovations in measurement systems throughout a career that began at Hewlett-Packard in 1982.
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