Most reliability workflows detect problems only after degradation appears.

✅ LockScore™ detects hidden structural instability earlier—before yield loss.

Mcap-Labs builds diagnostic technology for advanced semiconductor devices, analyzing I–V sweep data to surface instability signals that are not visible through conventional characterization methods.

This gives engineering and manufacturing teams earlier and clearer visibility into device behavior—enabling better decisions during development, pilot, ramp, and reliability programs.

What teams use ✅ LockScore for:

• Identify marginal and failure-prone devices earlier
• Compare process splits with greater confidence
• Reduce uncertainty during pilot, ramp, and qualification
• Surface latent instability before downstream yield loss

Focus areas:
ReRAM, PCM, selector devices, and advanced semiconductor programs

Evaluation format:
10–20 devices • 48–72 hour turnaround • GO / HOLD / NO-GO output

If you’re working on reliability or yield and want earlier visibility into instability risk:

👉 Request an Early Instability Evaluation

Mcap-Labs

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Mcap-Labs

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