Arnon David

Arnon David is a seasoned Post Si Engineering Lead at MDA Space, bringing over 20 years of expertise in product and test engineering for semiconductor integrated circuits. They have an extensive background in writing test programs and conducting reliability tests, having worked for prominent companies like Apple, Intel, and Qualcomm. Arnon has also served as a Senior Product & Test Engineer and a Reliability Test Manager, managing complex engineering projects and vendor relationships globally. In addition to their professional contributions, Arnon holds several patents and has experience as a patent agent, assisting inventors with applications in the engineering field. They earned a BSc in Computer and Electrical Engineering from the Technion.