Kun Zhang is a Senior Test Engineer at MediaTek, specializing in 4G and 5G modem chipset testing. With 6 years of experience in Android device testing, they have extensive knowledge of carrier technical acceptance processes and are adept at using various testing tools, including QXDM and Wireshark. Previously, Kun worked at Wiko USA as a Test Engineer and at XpertVantage as a Senior Field Test Engineer, where they conducted extensive KPI and functional testing for major US operators. They hold a Master of Science in Electrical Engineering from The University of Texas at Dallas and a Bachelor of Engineering from Taiyuan University of Technology.
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