Caleb Hood is a Senior Test Engineer at Menlo Micro, leveraging over six years of experience in the semiconductor industry. Previously at HFC Semiconductor Corp., Caleb developed and maintained test programs for MRAM devices, focusing on design validation and yield enhancement. Caleb also holds a Bachelor's degree in Electrical Engineering from the University of Utah and has extensive experience in DRAM device testing from their time at Micron Technology. Earlier in their career, Caleb worked as an electrical engineering intern at Quartzdyne, Inc., and was a music teacher at Roosevelt Middle School.
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