Erdem Erden is an experienced professional in optical engineering and metrology, with a robust background in research and development. Notably, Erdem served as a Graduate Research Assistant at Koç University and the University of Central Florida, contributing to projects focused on 3D display prototypes and optical phase conjugation. At Fraunhofer IPMS, Erdem interned in MEMS scanner testing, and later advanced to various roles at Alcon and Meta, including Optical Metrology Manager and Associate Director of Optical Metrology. Erdem holds Master's degrees in Optics/Optical Sciences and Electrical and Computer Engineering from the University of Central Florida and Koç University.
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