Javier Dacuña has extensive experience in electrical engineering and reliability testing, beginning with an internship at Tempos 21, where programming of a location platform using .NET Framework was completed. Following this, Javier served as a Staff Reliability R&D Engineer at Intel Corporation from April 2017 to April 2019, overseeing technology development for reliability certification, conducting electrical characterization, and assessing reliability risks, while also coordinating testing activities. Javier's roles at Intel progressed to Sr. Reliability R&D Engineer, focusing on experimental design and automation tools for reliability analysis. Currently, Javier is a Hardware Reliability Engineer at Meta. Prior positions include a Research Engineer at AIDA Centre, developing RFID systems, and an RF Engineer at Universitat Politècnica de Catalunya, enhancing RFID applications. Javier holds a Technical Engineering degree in Telecommunications from Universitat Politècnica de Catalunya and a Ph.D. in Electrical Engineering from Stanford University.
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