Aaron Moreno is an experienced engineering professional with a comprehensive background in reliability and test engineering. Currently serving as a Reliability Engineering Manager at Microchip Technology Inc. since April 2017, Aaron has previously held positions such as Test Engineer at Comtech EF Data and various roles at Intel Corporation, where significant achievements include developing a software solution that generated substantial cost savings and receiving a Department Recognition Award for improving test density in PCB designs. Aaron's career began in security and operations management, demonstrating a diverse skill set across multiple industries. Aaron holds a Bachelor of Science in Electrical and Computer Engineering from the University of Illinois Chicago.
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