Al Merino is an experienced failure analysis technician with a robust background in semiconductor technology and materials science. Currently serving as a Senior Failure Analysis Technician V at Microchip Technology Inc. since May 2023, Al specializes in FIB cross-sectioning and device modifications. Previous roles include Lab Specialist II at ASM, where skills in Advanced Dual Focus Ion Beam (DFIB) techniques and root cause analysis were developed, and Application Specialist at Allied High Tech Products, Inc., providing training and technical assistance globally. Al's extensive experience includes positions at Intel Corporation, ON Semiconductor, STMicroelectronics, General Dynamics, and several other companies, focusing on advanced sample preparation techniques and failure analysis. Al holds an Associate of Science Degree in Material Science from Don Bosco Technical Institute and has participated in various technical workshops and educational programs throughout a diverse career spanning over three decades.
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