Jennifer Cooper is an experienced technician in failure analysis with a career spanning over two decades in the semiconductor industry. Currently serving as a Failure Analysis Technician at Microchip Technology Inc. since August 2022, Jennifer has held various roles including Senior Technician at EAG Laboratories and Failure Analysis Engineer Photonics at Intel Corporation. Previous positions also include FIB/SEM Operator for TEM Prep at Applied Materials and Failure Analysis/Circuit Edit Engineer at Evans Analytical Group. Jennifer's career began as a Failure Analysis Engineer at Micron Technology and within the Circuit Edit Group at Intel Corporation. Jennifer holds a degree in Electron Microscopy from San Joaquin Delta College, earned between 1998 and 2003.
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