John Bayani is an accomplished professional in the semiconductor industry, currently serving as Test Engineering Manager at Microchip Technology Inc. since March 2015. With a comprehensive background that includes roles such as Principal Test Engineer at the same company and Chief Engineer for Test Development at ST Microelectronics, John has amassed significant experience in test engineering and development. Previous positions also include Sr. Test Product Engineer at NXP Semiconductors and various test development roles at Philips Semiconductor and ROHM Electronics, highlighting a robust career trajectory that began with a Junior Test Development Engineer position at ROHM LSI Design Philippines. John holds a degree from the Technological University of the Philippines, completed in 1999.
This person is not in any teams
This person is not in any offices