Salvador Cerna is a highly experienced test development engineer currently serving as a Staff Test Development Engineer at Microchip Technology Inc. since June 2023. Prior to this role, Salvador held the position of Sr Principal Test Development Engineer at On Semiconductor from June 1998 until March 2023, focusing on the design of hardware and software for integrated circuit test solutions, particularly for power management devices. Salvador possesses expertise with various test platforms, including Eagle test systems (series 300, 364, and 600), Motorola DTS systems, and Teradyne A360, and has responsibilities that encompass the definition of test specifications and plans, as well as design for testability analysis. Earlier in Salvador's career, from April 1994 to May 1998, Salvador worked as an ICT Test Engineer at Varian, Inc. Salvador holds a degree in Electronics from Universidad de Guadalajara, earned between 1987 and 1992.
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