Alistair Laing

Alistair Laing is an experienced semiconductor industry professional with over two decades of expertise in test solutions engineering and technical marketing. Currently serving as Director of Probe KEG Engineering at Micron Technology since October 2010, Alistair directs management of the Key Equipment Group and collaborates on manufacturing improvements and global processes in Wafer Probe. Prior roles include Senior Manager at FormFactor overseeing product marketing and technical interface with global accounts, and Manager of Test Program & Process Engineering at Infineon Technologies, where responsibilities included managing test engineering projects in a joint venture setting. Alistair began a career in semiconductor manufacturing at NEC Semiconductors, leading wafer test technical development. Alistair holds an MSC in Engineering Management and Systems Engineering from The George Washington University and a degree from Edinburgh Napier University.