DK Jiang is a seasoned professional in test solution engineering with extensive experience in the semiconductor industry. Currently serving as Director of Test Solution Engineering at Micron Technology since January 2018, DK Jiang previously held multiple roles at Intel from July 2005 to January 2018, including Senior Product Manager and Yield Engineering Manager. DK Jiang holds a Master’s Degree in Industrial Engineering from Sichuan University (2010-2014) and a double Bachelor's Degree in Micro-electronics and Business Administration from the University of Electronic Science and Technology of China (UESTC) (2001-2005).
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