Harshit Gupta is currently the ASIC-HSIO Validation Manager at Micron Technology, where they specialize in high-speed IP electrical validation and compliance testing. With previous experience at Intel, NVIDIA, NXP Semiconductors, and STMicroelectronics, Harshit has developed expertise in mixed signal validation and power performance correlation. They hold a Master’s Degree in Digital Electronics and Advanced Communication from Manipal Institute of Technology and an Engineer’s Degree in Electronics and Telecommunication Engineering. Harshit has led various innovative validation efforts, including the first Die2Die test chip at Intel, showcasing their leadership in advanced semiconductor technologies.
Location
Bengaluru, India
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