Jeffrey Ooi is a Test Engineering Manager at Micron Technology, having worked there since 2014, where they lead projects focused on improving manufacturing efficiency and ensuring test readiness for on-time delivery. Prior to this, they served as a Product Development Engineer at Intel Corporation from 2011 to 2014, where they developed test programs and scripts for complex equipment and supported the transition to production for significant processors. Jeffrey holds a Bachelor's degree in Microelectronics with Computer Communications, graduating with First Class Honors from Campbell University in 2011. Fluent in English and Chinese, they possess core competencies in Excel VBA, Linux, and data analysis.
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