Karine Florent is a Senior Manager of DRAM Device Characterization at Micron Technology, where they focus on emerging non-volatile memories, particularly those based on ferroelectricity. Previously, Karine has held various engineering and management roles in device characterization and has conducted extensive research during their PhD at KU Leuven on alternative vertical FET for 3D NAND applications. They earned a Master of Science in Electrical and Microelectronic Engineering from the Rochester Institute of Technology, achieving a perfect GPA. Karine also gained experience through internships and research positions, including work on photonic devices and ferroelectric materials.
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