Payel Chatterjee is a Device Reliability Engineer at Micron Technology, having previously served as a Senior Engineer in Device Reliability Validation. They interned at Micron Technology, India, focusing on Reliability Engineering and developing a device-to-circuit reliability analysis tool. Payel is currently a Research Scholar at the Indian Institute of Technology, Bombay, and is pursuing a PhD in Electrical and Electronics Engineering, expected to conclude in 2025. Additionally, they are working towards a Master of Science in Electronics at Jadavpur University.
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