Shayne Surla is a Senior Engineer Lead in Electrical Failure Analysis at Micron, bringing nine years of robust experience in Failure Analysis Engineering. Currently, they execute electrical analyses of DRAM products for RMA, Qualification, and Backend Failures, collaborating with cross-functional teams. Previously, Shayne held positions as a Failure Analysis Engineer at ON Semiconductor and Microchip Technology Inc., where they developed techniques to identify and resolve complex failures. Shayne holds a Bachelor's degree in Electrical and Electronics Engineering from the University of Santo Tomas, graduating Cum Laude, and is pursuing a Master's of Science in Electronics Engineering at Mapúa University.
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