Tyler Lenzi is a Senior Director of Yield Technology at Micron Technology, leading teams in Yield Enhancement and Analysis, Wafer Test, and Realtime Defect Analysis. With over 20 years of experience in semiconductor failure analysis, Tyler has held various leadership roles, including global director of failure analysis supporting R&D in the USA and Japan. They earned a Master’s degree in Materials Science and Engineering from the University of Florida and a Bachelor’s degree from Washington State University. Throughout their career, Tyler has overseen the investigation of failure analysis associated with new technologies and worked collaboratively with industry vendors.
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