Tyler Waite

Tyler Waite is the TSE Technology Development Senior Manager at Micron Technology, where they are responsible for wafer-level electrical testing for all R&D DRAM and Emerging Memory products. Prior to this role, Tyler held various engineering positions at Micron, including R&D Probe Test Engineering Manager and NAND and R&D Test Engineering Lead, where they managed teams and collaborated with cross-functional partners. Tyler began their career as a Test Analyst at Adecco Technical, focusing on identifying defects in firmware code. They earned a Bachelor of Science degree in Electrical Engineering from Boise State University.