Uma Sharma

Uma Sharma is a Semiconductor Device Reliability Engineer at Micron Technology, with experience dating back to April 2020. Previously served as a Device Engineer and Research Scholar at the Indian Institute of Technology, Bombay, from July 2014 to March 2020, focusing on front-end device reliability. Uma Sharma has also held the position of Visiting Researcher at IBM from June 2017 to February 2018, where a tool was developed to parameterize performance related to memory group die stack and back-end dielectrics deposition. Educational qualifications include a Research Scholar degree in Microelectronics from the Indian Institute of Technology, Bombay (2014-2019) and a Bachelor of Technology in Electrical, Electronics and Communications Engineering from Maharaja Surajmal Institute Of Technology (2009-2013).