Wayne Wei Chih Wang

Wayne Wei Chih Wang is a Senior Engineer at Micron Technology, specializing in semiconductor failure analysis and yield enhancement with nearly 15 years of industry experience. With over a decade dedicated to physical failure analysis (PFA) for DRAM, they focus on electrical characterization and fault isolation using advanced techniques. Wayne has been recognized for their contributions to yield ramp efforts across multiple product generations and has published three technical papers along with holding five granted patents. Before their current role, Wayne served as a production engineering manager at Highlightled, leading a team in yield monitoring and process improvement. They earned a Master’s degree in Physics from National Sun Yat-Sen University, where their thesis investigated the properties of gold-silicon films.