Wei Leng Cheok is a Test Engineering Manager at Micron Technology, specializing in innovating memory and storage solutions. With over 20 years of experience in the field, Wei previously held roles at onsemi, ON Semiconductor, Xyratex, and Seagate Technology, where they led engineering teams and developed manufacturing test strategies. Wei holds a Bachelor's degree in Electrical/Electronic Engineering from the National University of Malaysia. They are recognized as a Gen-AI pioneer and advocate for diversity, equity, and inclusion.
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