Tasnuva Rahman is a Senior Hardware Engineer specializing in Design for Test (DFT) at Microsoft, focusing on scan, ATPG, and yield improvement techniques. With a strong background in product diagnostics and engineering, they have previously held roles at GLOBALFOUNDRIES and Micron Technology, where they coordinated testing and analysis for DRAM products. Tasnuva has also contributed as a research assistant in solar cell technology and served as a peer mentor and teaching assistant at Arizona State University. Currently, they are pursuing a Master's degree in Analog and Mixed Signal Analysis.
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