Jonathan Adler serves as a Failure Analysis Engineer at Mobileye since June 2017, focusing on the analysis and debugging of electrical failures in integrated circuits and CPU chips, and collaborating with global hardware manufacturers to address root causes and implement corrective actions. Previously, Jonathan worked as an Electronic Engineer at T-MAX Electronic Engineering Ltd from September 2012 to June 2013, where responsibilities included characterization and repair of printed circuits and electronic systems using a range of test equipment. Jonathan holds a Master of Science in Artificial Intelligence from Afeka Tel Aviv Academic College of Engineering, and a Bachelor of Science in Electrical and Electronics Engineering from Holon Institute of Technology. Additional educational experience includes a Practical Engineering degree in the same field from AMAL Technological College.
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