NanoScience Solutions, Inc. (NSS) is a cutting edge company aimed at the development and manufacturing of advanced products for quantitative atomic force microscopy. At present, we offer two families of products used as extensions to the existing AFMs:

Ringing ModeTM attachment adds multidimensional imaging of physical properties of a sample surface. This modality allows users to obtain unique information of a sample surface which cannot be obtained with any of the existing modalities (including other types of microscopy beyond AFM). Eight quantitative channels of physical information can be recorded simultaneously within a single scan.  
      Compared to the rival (sub-resonance tapping) modes, Ringing ModeTM is up to 20x faster, with fewer artifacts, and produces higher lateral resolution.

FT-NanoDMA attachment is a fast dynamical mechanical analyzer (nanoDMA), which allows for simultaneous recording of mechanical dynamical properties at different oscillation frequencies (several oscillation frequencies are sent to the sample simultaneously). This patented technology is based on the Fourier Transformation, which is similar to the applied in Fourier transform nano rheology and FTIR spectroscopy. 
       This approach allows users to measure dynamical mechanical properties of materials (storage, loss moduli, loss tangent, etc.) about 100x faster and allows for more than 100x better spatial resolution compared to the existing nanoindenters. This increase in resolution is comparable with the transfer from optical to electron microscopy when applied to soft materials!

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