Nearfield Instruments develops and markets High-Throughput Scanning Probe Metrology systems for semiconductor manufacturing

Electronics

Manufacturing

Semiconductor

Nearfield Instruments

The Rotterdam office specializes in logistics, engineering, software development, and project management for advanced technology solutions.

Rotterdam

The Eindhoven office focuses on engineering and technology solutions, specializing in AIT, software development, and system integration.

Eindhoven

Hamed Sadeghian

Ray Ciferno

Nathasja Mastenbroek

Roland Van Vliet

This department focuses on engineering qualifications and production processes.

Engineering Services

This department specializes in the design, development, and testing of mechanical and mechatronic systems.

Mechatronics Engineering

The Engineering Team at Nearfield Instruments is responsible for the design, development, and integration of advanced scanning probe metrology systems used in semiconductor manufacturing. This multidisciplinary team collaborates on the mechanical, electrical, and software components of the systems, ensuring optimal performance and reliability. They focus on innovation and continuous improvement to enhance High-Throughput Scanning Probe capabilities, supporting the company's mission to advance semiconductor technology.

Engineering Team

This department focuses on designing, developing, and maintaining software applications.

Software Development

This department focuses on the design, qualification, and mechanical aspects of field installation processes.

Field Installation Engineering

This department focuses on the application and development of metrology technology and solutions.

Nearfield Instruments

Org chart

Teams

Engineering Services

Mechatronics Engineering

Engineering Team

Software Development

Field Installation Engineering

Metrology Applications

Offices

Nearfield Instruments

Org chart

Teams

Engineering Services

Mechatronics Engineering

Engineering Team

Software Development

Field Installation Engineering

Metrology Applications

Offices

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