Hojae Lee

Hojae Lee is a Principal Test Engineer at Netlist, Inc, with extensive experience in product and test engineering. Starting a career at Hynix Semiconductor from 1988 to 2004, Hojae Lee developed wafer test programs and package programs for various memory products. Subsequently, at Qimonda from 2004 to 2008, Hojae Lee defined and developed high-speed test conditions and programs for DDR2, GDDR3, and XDR products. Hojae Lee holds a Bachelor's degree in Electronics Engineering from Inha University, obtained between 1984 and 1988.