Michael Schmidt is an accomplished leader in the fields of engineering and technology with extensive experience in wafer testing and semiconductor processes. Currently serving as the Leader of Wafer Test at Nokia since April 2020, following the company’s acquisition of Elenion Technologies, Michael previously held the position of Engineering Manager at Elenion Technologies, overseeing the bare-die test team and developing custom hardware and software for wafer testing from March 2016 to March 2020. Prior roles include Senior Process Technology Development Engineer at Intel Corporation, contributing to next-generation manufacturing processes, and Graduate Research Assistant at The James Franck Institute, focusing on solid-state physics research. Michael earned a Ph.D. in Condensed Matter and Materials Physics from the University of Chicago, where additional degrees in Physics were also obtained.
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