Tom Strelchun

Tom Strelchun is the Vice President of Product Validation and Test at Nokia, where they lead a team focused on developing hardware and software methods for the testing of Photonic Integrated Circuits (PICs). Previously, they held roles including Sr. Director of Test NPI Development at Infinera, where they oversaw the development of test methods for 2400 Gb/s PICs, and Director of Test Development at Cenix, leading a project on automated test equipment for optoelectronic components. With a Master’s degree in Electrical/Optical Engineering from Lehigh University and a Bachelor’s in Electrical Engineering from the University of Scranton, Tom brings extensive experience in high-speed digital lightwave telecommunications systems, having begun their career at Lucent/AT&T.