Paul Isbester is an accomplished Application Scientist at Nova Measuring Instruments, where they apply scatterometry and x-ray metrology in semiconductor manufacturing. Previously, they served as a Group Leader and Senior Research Scientist at AMRI from 2000 to 2011, managing spectroscopy and pre-formulation teams and ensuring compliance with regulatory guidelines. They also contributed as a Bruker Biospin Research Associate at York University, developing advanced techniques for high throughput analysis. Currently, Paul is pursuing a Bachelor of Science in Chemistry from the State University of New York College at Oswego and a Ph.D. in Analytical Chemistry/Materials Science from the University of Minnesota-Twin Cities.
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