Sergey Borodyansky is a highly experienced Senior Software Engineer with a robust background in software development for metrology tools and data analysis in the semiconductor and security industries. Currently at Nova Measuring Instruments since October 2015, Borodyansky previously held senior engineering roles at KLA-Tencor, Solyndra, Applied Biosystems, Qylur Security Systems Inc., Metris, FEI Company, and Surface Interface Inc. Notable contributions include developing 3D modeling software for semiconductor characterization, inline metrology software for photovoltaic tube analysis, and algorithms for DNA sequencing. Sergey holds a Master’s Degree in Physics from Lomonosov Moscow State University and a Ph.D. in Physics, Spectroscopy, and Surface Science from VNICPV.
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