Sonal D. is an experienced Reliability and Metrology Engineer with over 10 years in semiconductor development, specializing in defect reliability, failure analysis, and statistical process control for advanced nodes. Currently, Sonal serves as the Applications Team Lead at Nova Ltd. and previously held positions at GLOBALFOUNDRIES and Intel Corporation, where they significantly improved operational efficiencies and defect reduction measures. Sonal earned a PhD in Physics from Kent State University, complemented by multiple advanced degrees in Physics from prestigious institutions. Their expertise in advanced materials and metrology has made them a valuable asset in the field.
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