Shi Jin is a Sr. DFT Engineer at NVIDIA, specializing in data-driven design and test methodologies for SoC chips and high-performance computing systems. Previously, Shi held positions at AMD and Huawei Technologies, where they contributed to various projects focused on fault diagnosis systems and anomaly detection. Shi's research at Duke University resulted in a paper selected by the 22nd Asian Test Symposium. They earned a PhD and a Master's degree in Electrical and Computer Engineering from Duke University and a Bachelor's degree in Telecommunications Engineering from Nanjing University of Posts and Telecommunications.
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