Mark H.

Mark H. is a Metrology Engineer at NY CREATES since August 2023, focusing on X-Ray and Thin Film Metrology as well as CSAM and Defect Characterization. Previously, Mark served as Engineer II at onsemi from January to July 2023, where responsibilities included Contamination Control and Analytical Chemistry, specifically Measurement System Analysis and Inline VPD-ICPMS. Between July 2018 and December 2022, Mark held the position of Senior Chemical Analysis Engineer at GlobalFoundries, contributing to continuous improvement and method development for enhanced limits of detection, while also serving as ISO Representative and receiving a CEO Award. Earlier in the career, Mark was a Chemical Analysis Engineer at GlobalFoundries, concentrating on Material Quality Assurance and analytical processes. Mark holds a Bachelor's degree in Chemical Engineering from the University at Buffalo.