Gray McPherson is a Senior Principal Quality & Reliability Engineer at onsemi, specializing in New Product Development (NPD) Quality & Reliability Engineering since 2025. With over a decade of experience in semiconductor manufacturing and advanced packaging, Gray has held various engineering roles at Intel and Aptiv, focusing on yield improvements and process integration. Gray earned a Master of Science in Electrical and Computer Engineering from the Georgia Institute of Technology and a Bachelor’s degree in Microelectronic Engineering from the Rochester Institute of Technology. Gray has demonstrated expertise in risk management and structured problem-solving, leading cross-functional teams to deliver high-quality solutions in advanced technologies.
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