Young C. Lee is a seasoned engineering professional with extensive experience in reliability engineering, currently serving as Sr Manager at ON Semiconductor since September 2016. In this role, Young C. Lee manages reliability tests for automotive integrated circuits, discrete, and module products, and participates as a voting member in the AQG324 working group organized by ECPE. Prior to this position, Young C. Lee held various roles at Fairchild Semiconductor, including Manager of Reliability Engineering, where responsibilities included managing automotive product reliability tests after relocating from South Korea. Young C. Lee also has a background in failure analysis and engineering roles at Fairchild and Samsung Electronics, focusing on product qualifications and analysis of reliability test failures. Young C. Lee holds a Master of Science degree in Electrical and Electronics Engineering from Yonsei University.
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