Xiaojing Yang

Xiaojing Yang has extensive experience in semiconductor engineering and nanotechnology, currently serving as an Exensio Application Engineer and DOE Owner at PDF Solutions since May 2005. Responsibilities include managing content for various front end of line (FEOL) and middle of line/back end of line (MOL/BEOL) test sites across multiple technologies, specifically at 22nm, 14nm, and 7nm nodes, with a focus on defining defectivity metrics to enhance yield. Previous experience as a Senior Consultant involved 22nm FEOL/MOL characterization support and yield improvement initiatives, while early work as an Application Engineer emphasized research and development in design methodologies. Before joining PDF Solutions, Xiaojing Yang was a Research Associate at Oak Ridge National Laboratory, specializing in e-beam lithography and nano-device fabrication. Educational credentials include a PhD in Materials Science and Engineering from the University of Tennessee, an MS in Physics from The University of North Carolina at Chapel Hill, and a BS in Physics from Jilin University.