Avashesh D. is a Reliability Engineer at Pragmatic since May 2023, focusing on reliability in semiconductor technology. Prior to this role, Avashesh served as a Postdoctoral Researcher at Universiteit Twente from May 2021 to May 2023, specializing in semiconductor wafer level reliability. Avashesh also completed a PhD at Delhi University from October 2015 to May 2021, where the research revolved around radiation effects in field effect transistors. Educational qualifications include a Bachelor's degree in Electronic Science and a Master's degree in Electronics, both from Delhi University, completed between 2010 and 2015.
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