Antonio Lie is currently the Director of Characterization & Test Automation at pSemi, A Murata Company, a role they have held since 2021. With a background in software engineering, they previously held positions as a Staff Software Engineer at National Instruments and a Senior Test Engineer at Peregrine Semiconductor. Antonio has also served as a Senior Software and Automation Manager at pSemi from 2017 to 2019. They earned a Bachelor of Science in Computer Engineering from the Instituto Tecnológico y de Estudios Superiores de Monterrey and a Master's Degree in Wireless Embedded Systems from the University of California, San Diego.
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