Antonio Lie is the Director of Characterization & Test Automation at pSemi, A Murata Company, where they have been since 2021. Previously, they served as a Senior Characterization & Test Automation Manager at the same company and held roles at National Instruments and Peregrine Semiconductor as a Staff Software Engineer and Automation Manager, respectively. Antonio earned a Master’s Degree in Wireless Embedded Systems from the University of California, San Diego, and a Bachelor of Science in Computer Engineering from Instituto Tecnológico y de Estudios Superiores de Monterrey. Their expertise includes TestStand, LabVIEW, C++, and strategic business management.
Location
San Diego, United States
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